Flash gate air gap

ABSTRACT

Flash memory cells and methods of formation are described for flash memory cells having air gaps through which electrons may pass to alter the charge state of the floating gate. A dummy gate is initially deposited and a polysilicon gate is deposited on the dummy gate. A silicon oxide film is then deposited on the sides of the active area, the dummy gate and the polysilicon. The silicon oxide film holds the polysilicon in place while the dummy gate is selectively etched away. The dummy gate may be doped to increase etch rate. Formerly, silicon oxide was used as a dielectric barrier through which electrons were passed to charge and discharge the floating gate (polysilicon). Eliminating material in the dielectric barrier reduces the tendency to accumulate trapped charges during use and increase the lifespan of flash memory devices.

FIELD

Embodiments of the invention relate to air gap flash gates and methodsof formation.

BACKGROUND

Integrated circuits are made possible by processes which produceintricately patterned material layers on substrate surfaces. Producingpatterned material on a substrate requires controlled methods forremoval of exposed material. Chemical etching is used for a variety ofpurposes including transferring a pattern in photoresist into underlyinglayers, thinning layers or thinning lateral dimensions of featuresalready present on the surface. Often it is desirable to have an etchprocess which etches one material faster than another helping e.g. apattern transfer process proceed. Such an etch process is said to beselective of the first material. As a result of the diversity ofmaterials, circuits and processes, etch processes have been developedthat selectively remove one or more of a broad range of materials.

Dry etch processes are often desirable for selectively removing materialfrom semiconductor substrates. The desirability stems from the abilityto gently remove material from miniature structures with minimalphysical disturbance. Dry etch processes also allow the etch rate to beabruptly stopped by removing the gas phase reagents. Some dry-etchprocesses involve the exposure of a substrate to remote plasmaby-products formed from one or more precursors. For example, remoteplasma generation of nitrogen trifluoride in combination with ionsuppression techniques enables silicon oxide to be isotropically andselectively removed from a patterned substrate when the plasma effluentsare flowed into the substrate processing region.

Methods are needed to broaden the utility of selective dry isotropicsilicon oxide etch processes.

SUMMARY

Flash memory cells and methods of formation are described for flashmemory cells having air gaps through which electrons may pass to alterthe charge state of the floating gate. A dummy gate is initiallydeposited and a polysilicon gate is deposited on the dummy gate. Asilicon oxide film is then deposited on the sides of the active area,the dummy gate and the polysilicon. The silicon oxide film holds thepolysilicon in place while the dummy gate is selectively etched away.The dummy gate may be doped to increase etch rate. Formerly, siliconoxide was used as a dielectric barrier through which electrons werepassed to charge and discharge the floating gate (polysilicon).Eliminating material in the dielectric barrier reduces the tendency toaccumulate trapped charges during use and increase the lifespan of flashmemory devices. During operation of the completed device, a largevoltage (e.g. 10's of volts) is applied between a wordline and activearea silicon when writing data to a cell. Repeated writings can trapcharges and alter the operating voltages of the cell, leading topremature failure. Replacing a silicon oxide gate dielectric with a voidor “air gap” removes this failure mode. A fluorine-containing precursoris excited in a remote plasma to form plasma effluents which are passedthrough an ion suppressor plate into a substrate processing region wherethey selectively etch the dummy gate. The etch selectivity of the dummygate (doped silicon oxide) relative to the structural silicon oxide isenabled by inclusion of an ion suppressor plate to ensure a low electrontemperature in the substrate processing region.

Embodiments of the invention include methods of forming a flash memorycell on a substrate. The methods include forming dummy silicon oxideover active area silicon on the substrate. The methods further includeforming polysilicon over the dummy silicon oxide. The methods furtherinclude patterning the polysilicon and the dummy silicon oxide into astack having vertical walls. The methods further include formingconformal silicon oxide on the vertical walls of the stack. Theconformal silicon oxide borders walls of the polysilicon, the dummysilicon oxide and the active area silicon. The methods further includeselectively removing the dummy silicon oxide to leave behind a void. Theconformal silicon oxide, the polysilicon and the active area silicon allremain in place following the selective removal of the dummy siliconoxide. The methods further include depositing non-conformal siliconoxide to trap the void in the flash memory cell.

Embodiments of the invention include flash memory cells. The flashmemory cells include an active area of silicon on the substrate. Theflash memory cells further include a polysilicon floating gate over theactive area of silicon. The polysilicon floating gate is verticallyseparated from the active area of silicon by a void in which there is nocondensed matter but only vacuum or material in a gas phase. The flashmemory cells further include conformal silicon oxide which contactssidewalls of both the polysilicon and the active area silicon. Theconformal silicon oxide also borders the void. The flash memory cellsfurther include non-conformal silicon oxide to trap the void in theflash memory cell.

Embodiments of the invention include methods of forming a flash memorycell on a substrate. The methods include forming dummy silicon oxideover active area silicon on the substrate. The methods further includeforming polysilicon over the dummy silicon oxide. The methods furtherinclude patterning the polysilicon and the dummy silicon oxide into astack having vertical walls. The methods further include formingconformal silicon oxide on the vertical walls of the stack. Theconformal silicon oxide borders a vertical wall of the polysilicon, avertical wall of the dummy silicon oxide and a vertical wall of theactive area silicon. The methods further include transferring thepatterned substrate into a substrate processing region of a substrateprocessing chamber. The methods further include flowing afluorine-containing precursor into a remote plasma region fluidlycoupled to the substrate processing region while forming a plasma in theremote plasma region to produce plasma effluents. The methods furtherinclude flowing the plasma effluents into the substrate processingregion housing the substrate. The plasma effluents flow into thesubstrate processing region through perforations in an ion suppressionelement disposed between the remote plasma region and the substrateprocessing region. The methods further include selectively removing thedummy silicon oxide with the plasma effluents to leave behind a void,wherein the conformal silicon oxide, the polysilicon and the active areasilicon all remain in place following the selective removal of the dummysilicon oxide. The methods further include depositing non-conformalsilicon oxide to trap the void in the flash memory cell.

Additional embodiments and features are set forth in part in thedescription that follows, and in part will become apparent to thoseskilled in the art upon examination of the specification or may belearned by the practice of the disclosed embodiments. The features andadvantages of the disclosed embodiments may be realized and attained bymeans of the instrumentalities, combinations, and methods described inthe specification.

DESCRIPTION OF THE DRAWINGS

A further understanding of the nature and advantages of the disclosedembodiments may be realized by reference to the remaining portions ofthe specification and the drawings.

FIG. 1 is a flow chart of a selective etch process for forming a flashmemory cell according to embodiments.

FIG. 2A is a collection of cross-sectional views before etching a dummygate according to embodiments.

FIG. 2B is a collection of cross sectional views after etching a dummygate according to embodiments.

FIG. 3A shows a substrate processing chamber according to embodiments ofthe invention.

FIG. 3B shows a showerhead of a substrate processing chamber accordingto embodiments of the invention.

FIG. 4 shows a substrate processing system according to embodiments ofthe invention.

In the appended figures, similar components and/or features may have thesame reference label. Further, various components of the same type maybe distinguished by following the reference label by a dash and a secondlabel that distinguishes among the similar components. If only the firstreference label is used in the specification, the description isapplicable to any one of the similar components having the same firstreference label irrespective of the second reference label.

DETAILED DESCRIPTION

Flash memory cells and methods of formation are described for flashmemory cells having air gaps through which electrons may pass to alterthe charge state of the floating gate. A dummy gate is initiallydeposited and a polysilicon gate is deposited on the dummy gate. Asilicon oxide film is then deposited on the sides of the active area,the dummy gate and the polysilicon. The silicon oxide film holds thepolysilicon in place while the dummy gate is selectively etched away.The dummy gate may be doped to increase etch rate. Formerly, siliconoxide was used as a dielectric barrier through which electrons werepassed to charge and discharge the floating gate (polysilicon).Eliminating material in the dielectric barrier reduces the tendency toaccumulate trapped charges during use and increases the lifespan offlash memory devices. A fluorine-containing precursor is excited in aremote plasma to form plasma effluents which are passed through an ionsuppressor plate into a substrate processing region where theyselectively etch the dummy gate. The etch selectivity of the dummy gate(doped silicon oxide) relative to the structural silicon oxide isenabled by inclusion of an ion suppressor plate to ensure a low electrontemperature in the substrate processing region.

In order to better understand and appreciate the invention, reference isnow made to FIG. 1 which is a flow chart of a method of forming a flashmemory cell 100 according to embodiments. Reference will concurrently bemade to FIGS. 2A-2B which are a collection of cross-sectional viewsbefore and after selectively etching a dummy gate according toembodiments. In each of FIG. 2A and FIG. 2B, the top-left view and themiddle view have the bitline direction in the plane of the image and thewordline direction into the image, i.e. perpendicular to the image. Thelower-right view has the bitline direction into the image, i.e.perpendicular to the image, and the wordline direction in the plane ofthe image. “Top” and “Up” will be used herein to describeportions/directions perpendicularly distal from the substrate plane andfurther away from the center of mass of the substrate in theperpendicular direction. “Vertical” will be used to describe itemsaligned in the “Up” direction towards the “Top”.

A layer of boron-doped silicon oxide 230-1 is formed over an active areaof silicon 220 in operation 110. Active area of silicon 220 is doped andmay be n-type in embodiments. Active area 220 may be doped withphosphorus according to embodiments. Boron-doped silicon oxide 230-1 maymore generally be doped silicon oxide (doped with a variety of elements)since the purpose of the dopant is simply to increase the etch rate inlater steps. The dopant of the doped silicon oxide is an element otherthan silicon or oxygen according to embodiments. For example the dopedsilicon oxide may be BSG (boron doped silicate glass, BPSG (boronphosphorus doped silicate glass) or PSG (phosphorus doped silicate glassin embodiments. A layer of nitridation may be formed between the activearea and doped silicon oxide 230-1, in embodiments, in order to avoidcontaminating the active area with dopants from doped silicon oxide230-1. The nitridation layer may be silicon nitride or siliconoxynitride. Doped silicon oxide 230-1 may be referred to herein as adummy silicon oxide or a dummy gate oxide since the material will notremain in the completed device.

A layer of polysilicon 250 is deposited over or on dummy gate oxide230-1 in operation 120. The polysilicon will later be electricallydisconnected from all active areas and other conducting elements andtherefore may be referred to herein as a floating gate. Polysilicon 250may be doped and may be n-type polysilicon in embodiments. Polysilicon250 may be doped using boron as dopant.

Floating gate 250, dummy gate 230-1 and active area 220 are patternedwith an isotropic removal process, a.k.a. an isotropic etch processes(or multiple anisotropic etch processes) to form a stack in operation130. Floating gate 250 is electrically isolated from all otherconducting components during operation 130. An exemplary technology forperforming an anisotropic etch process is reactive ion etching in whichreactive ions are preferentially accelerated toward the substrate.

A conformal layer of silicon oxide 240 is deposited on the walls of thestack in operation 140. Conformal silicon oxide 240 may be deposited asa high temperature oxide (HTO) using an oxygen precursor at elevatedsubstrate temperature (˜750° C.-900° C. is typical). Regardless ofdeposition technique, conformal silicon oxide 240 may be more dense thandummy gate 230-1 and may be lightly doped or intrinsic so conformalsilicon oxide 240 can withstand a selective etch process to later removedummy gate oxide 230-1. Conformal silicon oxide 240 borders verticalwalls of floating gate 250, vertical walls of dummy gate 230-1 andvertical walls of active area 220. In this way, conformal silicon oxide240 will be used to hold floating gate 250 and active area 220 in placeafter dummy gate 230-1 is removed in the next operation. The thicknessof conformal silicon oxide 240 must be sufficient to hold floating gate250 in place relative to active area 220 so the desirable void willremain in subsequent operation 150. The thickness of conformal siliconoxide 240 may be greater than 2.5 nm, greater than 3 nm, greater than3.5 nm, or between 3 and 5 nm according to embodiments.

Shallow trench isolation (STI) fill or gapfill 260-1 is deposited inoperation 150. STI fill 260-1 is typically a flowable deposition ofsilicon oxide having a quality more similar to dummy gate oxide 230-1than to conformal silicon oxide 240. That is, STI fill 260-1 will etchrapidly compared to conformal silicon oxide 240. The patterned substratemay then be planarized using chemical mechanical polishing (CMP), inembodiments, as shown in operation 150.

The patterned substrate is transferred into a substrate processingregion to effect a highly selective and isotropic etching process. Thesetwo properties enable this process to find its way around polysilicon250 to access and remove dummy gate oxide 230-1 while retaining all theother desirable articles shown in FIG. 2 in embodiments. Nitrogentrifluoride is flowed into a remote plasma region and a remote plasmapower is applied to form plasma effluents. The remote plasma region isseparated from the substrate processing region by a nickel-platedperforated plate configured to neutralize ions while retaining reactiveradicals during passage. Plasma effluents are neutralized while passingthrough the perforated plate and then flowed into the substrateprocessing region. The nickel-plated perforated plate may be referred toherein as an ion suppression element or an ion suppressor. Other sourcesof fluorine may be used to augment or replace the nitrogen trifluoride.In general, a fluorine-containing precursor may be flowed into theremote plasma region and the fluorine-containing precursor may includeone or more of atomic fluorine, diatomic fluorine, boron trifluoride,chlorine trifluoride, nitrogen trifluoride, perfluorinated hydrocarbons,sulfur hexafluoride and xenon difluoride. Dummy gate oxide 230 and STIfill 260 etch rapidly relative to conformal silicon oxide 240 as aresult of the nature of the etchants and the lack of ions in thesubstrate processing region. Dummy gate oxide 230 and STI fill 260 onthe patterned substrate is selectively etched relative to conformalsilicon oxide 240, active area 220 and polysilicon 250 (operation 160).The selective etching of STI fill is optional but the selective etchingof dummy gate oxide 230 is present in all embodiments described herein.The reactive chemical species and any process effluents are removed fromthe substrate processing region and then the substrate is removed fromthe substrate processing region.

Dummy gate oxide 230 is removed entirely, in embodiments, to form gatevoid 230-2 bordered by conformal silicon oxide 240, active area silicon220 and polysilicon 250. STI fill 260 is only partially removed to formadditional voids aligned in the wordline direction. Gate void 230-2 isdistinguished from the additional (and optional) void in the wordlinedirection. A vertical thickness of gate void 230-2 may be less than 6.5nm, less than 5.5 nm, less than 5.0 nm or less than 4.5 nm according toembodiments. A vertical thickness of gate void 230-2 may be greater than2.5 nm, greater than 3.0 nm, greater than 3.5 nm or greater than 4.0 nm,in embodiments, to avoid arcing during application of relatively highvoltages during writing operations. A horizontal width of gate void230-2 may be less than 30 nm, less than 25 nm, less than 20 nm or lessthan 15 nm according to embodiments. A horizontal width of gate void230-2 may be greater than 8 nm, greater than 10 nm, greater than 12 nmor greater than 15 nm in embodiments.

Without a gate void, and using condensed matter such as silicon oxidefor the dielectric gap, the thickness of the gate dielectric was limitedto about 6.5 nm and generally between 7.0 nm and 8.0 nm. Using a gatedielectric thinner than 6.5 nm resulted in a degradation in flash celllifespan as a result of an accumulation of trapped charges within thegate dielectric during operation. The accumulation of trapped chargesmay result in a migration of the voltage necessary to read or write theflash memory cell, and may result in a phenomenon referred to asself-induced leakage current (SiLC).

The remote plasma region is located within a compartment within thesubstrate processing chamber between the electrode and the perforatedplate. The remote plasma region may is fluidly coupled to the substrateprocessing region by way of perforations in perforated plate. Thehardware just described (and elaborated on in the equipment section) mayalso be used in all processes discussed herein. The perforated plate maybe the showerhead described herein or it may be the ion suppressionelement according to embodiments. The perforated plate may also describethe combination of an ion suppression element and a showerhead.

Generally speaking, selective etching operation 160 may remove dopedsilicon oxide faster than undoped silicon oxide, silicon nitride,intrinsic silicon, n-type silicon or p-type silicon according toembodiments. The etch selectivity of doped silicon oxide relative toeach of these other materials (including HTO) may be greater than orabout 100:1, greater than or about 200:1, greater than or about 300:1 orpreferably greater than or about 500:1 according to embodiments. Theseselectivities also apply to STI fill.

Operation 160 also includes applying energy to the fluorine-containingprecursor in the remote plasma region to generate the plasma effluents.The plasma may be generated using RF frequencies such as 13.56 MHzapplied using capacitively-coupled power according to embodiments. Theremote plasma source power may be between about 10 watts and about 3000watts, between about 20 watts and about 2000 watts, between about 30watts and about 1000 watts in embodiments.

In all embodiments described herein which use a remote plasma, the term“plasma-free” may be used to describe the substrate processing regionduring application of no or essentially no plasma power. A plasma-freesubstrate processing region may be used during selective etchingoperation 160 in embodiments.

In embodiments, the fluorine-containing precursor (e.g. NF₃) is suppliedat a flow rate of between about 5 sccm and about 500 sccm, between about10 sccm and about 300 sccm, between about 25 sccm and about 200 sccm,between about 50 sccm and about 150 sccm or between about 75 sccm andabout 125 sccm. As described in the exemplary equipment section, HxOyNzmay be added through an unexcited input to increase selectivity ofsilicon oxide in embodiments. The temperature of the substrate for allembodiments described herein may be greater than 0° C. during the etchprocess. The substrate temperature may be greater than or about −20° C.and less than or about 300° C. The pressure in the substrate processingregion may be similar to the pressure in the remote plasma region duringsubstrate processing method 300. The pressure within the substrateprocessing region may be below or about 10 Torr, below or about 5 Torr,below or about 3 Torr, below or about 2 Torr, below or about 1 Torr orbelow or about 750 mTorr according to embodiments. In order to ensureadequate etch rate, the pressure may be above or about 0.05 Torr, aboveor about 0.1 Torr, above or about 0.2 Torr or above or about 0.4 Torr inembodiments. Any of the upper limits on pressure may be combined withlower limits according to embodiments.

In each remote plasmas described herein, the flows of the precursorsinto the remote plasma region may further include one or more relativelyinert gases such as He, N₂, Ar. The inert gas can be used to improveplasma stability, ease plasma initiation, and improve processuniformity. Argon is helpful, as an additive, to promote the formationof a stable plasma. Process uniformity is generally increased whenhelium is included. These additives are present in embodimentsthroughout this specification. Flow rates and ratios of the differentgases may be used to control etch rates and etch selectivity.

In embodiments, an ion suppressor as described in the exemplaryequipment section may be used to provide radical and/or neutral speciesfor selectively etching substrates. The ion suppressor may also bereferred to as an ion suppression element. In embodiments, for example,the ion suppressor is used to filter fluorine-containing plasmaeffluents to selectively etch doped silicon oxide. The ion suppressormay be included in each exemplary process described herein. Using theplasma effluents, an etch rate selectivity of a selected material to awide variety of materials may be achieved.

The ion suppressor may be used to provide a reactive gas having a higherconcentration of radicals than ions. The ion suppressor functions todramatically reduce or substantially eliminate ionically charged speciestraveling from the plasma generation region to the substrate. Theelectron temperature may be measured using a Langmuir probe in thesubstrate processing region during excitation of a plasma in the remoteplasma region on the other side of the ion suppressor. In embodiments,the electron temperature may be less than 0.5 eV, less than 0.45 eV,less than 0.4 eV, or less than 0.35 eV. These extremely low values forthe electron temperature are enabled by the presence of the showerheadand/or the ion suppressor positioned between the substrate processingregion and the remote plasma region. Uncharged neutral and radicalspecies may pass through the openings in the ion suppressor to react atthe substrate. Because most of the charged particles of a plasma arefiltered or removed by the ion suppressor, the substrate is notnecessarily biased during the etch process. Such a process usingradicals and other neutral species can reduce plasma damage compared toconventional plasma etch processes that include sputtering andbombardment. The ion suppressor helps control the concentration of ionicspecies in the reaction region at a level that assists the process.Embodiments of the present invention are also advantageous overconventional wet etch processes where surface tension of liquids cancause bending and peeling of small features. Ions may erode thedesirable conformal silicon oxide 240 so the ion suppressor is includedto prevent such erosion. A lack of bias power also protects conformalsilicon oxide 240 from erosion. A lack of ions during selective etchingoperation 160 may avoid the accumulation of trapped ions in other waysas well in embodiments.

In general, the conformal silicon oxide may be less doped than the dummygate oxide in embodiments. The conformal silicon oxide may beessentially undoped or doped with a dopant concentration less than orabout 10¹³ cm⁻³. In contrast, dummy gate silicon oxide may have a dopantconcentration greater than or about 10¹⁵ cm⁻³, greater than or about10¹⁶ cm⁻³, greater than or about 10¹⁷ cm⁻³ or greater than or about 10¹⁸cm⁻³ according to embodiments. Similarly, STI fill may be silicon oxidehaving a dopant concentration greater than or about 10¹⁵ cm⁻³, greaterthan or about 10¹⁶ cm⁻³, greater than or about 10¹⁷ cm⁻³ or greater thanor about 10¹⁸ cm⁻³ in embodiments.

Inter-poly dielectric (IPD) and a conductor may subsequently bedeposited and patterned (not shown in the figures) following theselective etch (operation 160). Following these depositions, Anon-conformal dielectric (e.g. silicon oxide in the above examples orsilicon nitride or silicon oxynitride as other examples) is depositedover the substrate to trap voids (a.k.a. “air gaps”) in betweenpolysilicon 250 and active area silicon 220. Voids may also be trappedin between adjacent active area silicons 220 to further improve deviceperformance in some embodiments. The air gaps between polysilicon 250and active area silicon 220 are referred to as gate voids 230 herein andserve to increase longevity of the completed device. The air gapsbetween adjacent active area silicons 220 are more traditional air gapswhich serve to decrease the local dielectric constant thereby loweringpower consumption and/or increasing circuit speed.

Additional process parameters are disclosed in the course of describingan exemplary processing chamber and system.

Exemplary Processing System

Processing chambers that may implement embodiments of the presentinvention may be included within processing platforms such as theCENTURA® and PRODUCER® systems, available from Applied Materials, Inc.of Santa Clara, Calif.

FIG. 4A is a substrate processing chamber 1001 according to embodiments.A remote plasma system 1010 may process a fluorine-containing precursorwhich then travels through a gas inlet assembly 1011. Two distinct gassupply channels are visible within the gas inlet assembly 1011. A firstchannel 1012 carries a gas that passes through the remote plasma system1010 (RPS), while a second channel 1013 bypasses the remote plasmasystem 1010. Either channel may be used for the fluorine-containingprecursor in embodiments. On the other hand, the first channel 1012 maybe used for the process gas and the second channel 1013 may be used fora treatment gas. The lid (or conductive top portion) 1021 and aperforated partition 1053 are shown with an insulating ring 1024 inbetween, which allows a oscillating voltage to be applied to the lid1021 relative to perforated partition 1053. The oscillating voltagestrikes a plasma in chamber plasma region 1020. The process gas maytravel through first channel 1012 into chamber plasma region 1020 andmay be excited by a plasma in chamber plasma region 1020 alone or incombination with remote plasma system 1010. If the process gas (thefluorine-containing precursor) flows through second channel 1013, thenonly the chamber plasma region 1020 is used for excitation. Thecombination of chamber plasma region 1020 and/or remote plasma system1010 may be referred to as a remote plasma region herein. The perforatedpartition (also referred to as a showerhead) 1053 separates chamberplasma region 1020 from a substrate processing region 1070 beneathshowerhead 1053. Showerhead 1053 allows a plasma present in chamberplasma region 1020 to avoid directly exciting gases in substrateprocessing region 1070, while still allowing excited species to travelfrom chamber plasma region 1020 into substrate processing region 1070.

Showerhead 1053 is positioned between chamber plasma region 1020 andsubstrate processing region 1070 and allows plasma effluents (excitedderivatives of precursors or other gases) created within remote plasmasystem 1010 and/or chamber plasma region 1020 to pass through aplurality of through-holes 1056 that traverse the thickness of theplate. The showerhead 1053 also has one or more hollow volumes 1051which can be filled with a precursor in the form of a vapor or gas (suchas the fluorine-containing precursor) and pass through blind-holes 1055into substrate processing region 1070 but not directly into chamberplasma region 1020. Showerhead 1053 is thicker than the length of thesmallest diameter 1050 of the through-holes 1056 in embodiments. Tomaintain a significant concentration of excited species penetrating fromchamber plasma region 1020 to substrate processing region 1070, thelength 1026 of the smallest diameter 1050 of the through-holes may berestricted by forming larger diameter portions of through-holes 1056part way through the showerhead 1053. The length of the smallestdiameter 1050 of the through-holes 1056 may be the same order ofmagnitude as the smallest diameter of the through-holes 1056 or less inembodiments. Showerhead 1053 may be referred to as a dual-channelshowerhead, a dual-zone showerhead, a multi-channel showerhead or amulti-zone showerhead to convey the existence of through-holes andblind-holes for introducing precursors.

Hollow volumes 1051 may be filled with an unexcited precursor forcombining with the plasma effluents passing through through-holes 1056.The combination occurs in substrate processing region 1070. Theunexcited precursor passes through blind-holes 1055 prior to thecombination. Exemplary unexcited precursors which have been found toassist in the selective removal of silicon oxide include moisture (H₂O),hydrogen peroxide (H₂O₂), ammonia (NH₃) and hydrazine (N₂H₄). Theunexcited precursors may more generally have the form HxOyNz, where x, yand z are integers (y or z may further be zero, but y and z cannot bothbe zero).

Showerhead 1053 may be configured to serve the purpose of an ionsuppressor as shown in FIG. 4A. Alternatively, a separate processingchamber element may be included (not shown) which suppresses the ionconcentration traveling into substrate processing region 1070. Lid 1021and showerhead 1053 may function as a first electrode and secondelectrode, respectively, so that lid 1021 and showerhead 1053 mayreceive different electric voltages. In these configurations,oscillating electrical power may be applied to lid 1021, showerhead1053, or both. For example, electrical power may be applied to lid 1021while showerhead 1053 (and/or an ion suppressor) is grounded. Thesubstrate processing system may include an oscillating voltage generatorthat provides electrical power to the lid 1021 or showerhead 1053 whilethe other is grounded. The voltage applied to lid 1021 may facilitate auniform distribution of plasma (i.e., reduce localized plasma) withinchamber plasma region 1020. To enable the formation of a plasma inchamber plasma region 1020, insulating ring 1024 may electricallyinsulate lid 1021 from showerhead 1053. Insulating ring 1024 may be madefrom a ceramic and may have a high breakdown voltage to avoid sparkingPortions of substrate processing chamber 1001 near thecapacitively-coupled plasma components just described may furtherinclude a cooling unit (not shown) that includes one or more coolingfluid channels to cool surfaces exposed to the plasma with a circulatingcoolant (e.g., water).

In the embodiment shown, showerhead 1053 may distribute (viathrough-holes 1056) process gases which contain fluorine and/or plasmaeffluents of fluorine upon excitation by a plasma in chamber plasmaregion 1020. In embodiments, the process gas introduced into the remoteplasma system 1010 and/or chamber plasma region 1020 may containfluorine. The process gas may also include a carrier gas such as helium,argon, nitrogen (N₂), etc. Plasma effluents may include ionized orneutral derivatives of the process gas and may also be referred toherein as radical-fluorine referring to at least one of the atomicconstituents of the process gas introduced.

Through-holes 1056 are configured to suppress the migration ofionically-charged species out of the chamber plasma region 1020 whileallowing uncharged neutral or radical species to pass through showerhead1053 into substrate processing region 1070. These uncharged species mayinclude highly reactive species that are transported with less-reactivecarrier gas by through-holes 1056. As noted above, the migration ofionic species by through-holes 1056 may be reduced, and in someinstances completely suppressed. Controlling the amount of ionic speciespassing through showerhead 1053 provides increased control over the gasmixture brought into contact with the underlying wafer substrate, whichin turn increases control of the deposition and/or etch characteristicsof the gas mixture. For example, adjustments in the ion concentration ofthe gas mixture can alter the etch selectivity (e.g., the doped siliconoxide:silicon oxide etch rate ratio).

In embodiments, the number of through-holes 1056 may be between about 60and about 2000. Through-holes 1056 may have a variety of shapes but aremost easily made round. The smallest diameter 1050 of through-holes 1056may be between about 0.5 mm and about 20 mm or between about 1 mm andabout 6 mm in embodiments. There is also latitude in choosing thecross-sectional shape of through-holes, which may be made conical,cylindrical or combinations of the two shapes. The number of blind-holes1055 used to introduce unexcited precursors into substrate processingregion 1070 may be between about 100 and about 5000 or between about 500and about 2000 in different embodiments. The diameter of the blind-holes1055 may be between about 0.1 mm and about 2 mm.

Through-holes 1056 may be configured to control the passage of theplasma-activated gas (i.e., the ionic, radical, and/or neutral species)through showerhead 1053. For example, the aspect ratio of the holes(i.e., the hole diameter to length) and/or the geometry of the holes maybe controlled so that the flow of ionically-charged species in theactivated gas passing through showerhead 1053 is reduced. Through-holes1056 in showerhead 1053 may include a tapered portion that faces chamberplasma region 1020, and a cylindrical portion that faces substrateprocessing region 1070. The cylindrical portion may be proportioned anddimensioned to control the flow of ionic species passing into substrateprocessing region 1070. An adjustable electrical bias may also beapplied to showerhead 1053 as an additional means to control the flow ofionic species through showerhead 1053.

Alternatively, through-holes 1056 may have a smaller inner diameter (ID)toward the top surface of showerhead 1053 and a larger ID toward thebottom surface. In addition, the bottom edge of through-holes 1056 maybe chamfered to help evenly distribute the plasma effluents in substrateprocessing region 1070 as the plasma effluents exit the showerhead andpromote even distribution of the plasma effluents and precursor gases.The smaller ID may be placed at a variety of locations alongthrough-holes 1056 and still allow showerhead 1053 to reduce the iondensity within substrate processing region 1070. The reduction in iondensity may result from an increase in the number of collisions withsurfaces prior to entry into substrate processing region 1070. Eachcollision increases the probability that an ion is neutralized by theacquisition or loss of an electron from the wall. Generally speaking,the smaller ID of through-holes 1056 may be between about 0.2 mm andabout 20 mm. In other embodiments, the smaller ID may be between about 1mm and 6 mm or between about 0.2 mm and about 5 mm. Further, aspectratios of the through-holes 1056 (i.e., the smaller ID to hole length)may be approximately 1 to 20. The smaller ID of the through-holes may bethe minimum ID found along the length of the through-holes. Thecross-sectional shape of through-holes 1056 may be generallycylindrical, conical, or any combination thereof.

FIG. 4B is a bottom view of a showerhead 1053 for use with a processingchamber according to embodiments. Showerhead 1053 corresponds with theshowerhead shown in FIG. 4A. Through-holes 1056 are depicted with alarger inner-diameter (ID) on the bottom of showerhead 1053 and asmaller ID at the top. Blind-holes 1055 are distributed substantiallyevenly over the surface of the showerhead, even amongst thethrough-holes 1056 which helps to provide more even mixing than otherembodiments described herein.

An exemplary patterned substrate may be supported by a pedestal (notshown) within substrate processing region 1070 when fluorine-containingplasma effluents arrive through through-holes 1056 in showerhead 1053.Though substrate processing region 1070 may be equipped to support aplasma for other processes such as curing, no plasma is present duringthe etching of patterned substrate, in embodiments.

A plasma may be ignited either in chamber plasma region 1020 aboveshowerhead 1053 or substrate processing region 1070 below showerhead1053. A plasma is present in chamber plasma region 1020 to produce theradical-fluorine from an inflow of the fluorine-containing precursor. Aoscillating voltage (shifted or otherwise transformed to generallyconfine to one polarity) is applied between the conductive top portion(lid 1021) of the processing chamber and showerhead 1053 to ignite aplasma in chamber plasma region 1020 during deposition. The oscillatingvoltage applied to lid 1021 is shifted such to not center about thepotential of showerhead 1053. A oscillating voltage power supplygenerates a oscillating frequency of less than or about 1,000 kHz, lessthan or about 500 kHz, less than or about 300 kHz or between 1 kHz and200 kHz according to embodiments.

The top plasma may be left at low or no power when the bottom plasma inthe substrate processing region 1070 is turned on to either cure a filmor clean the interior surfaces bordering substrate processing region1070. A plasma in substrate processing region 1070 is ignited byapplying the oscillating voltage between showerhead 1053 and thepedestal or bottom of the chamber. A cleaning gas may be introduced intosubstrate processing region 1070 while the plasma is present.

The pedestal may have a heat exchange channel through which a heatexchange fluid flows to control the temperature of the substrate. Thisconfiguration allows the substrate temperature to be cooled or heated tomaintain relatively low temperatures (from room temperature throughabout 120° C.). The heat exchange fluid may comprise ethylene glycol andwater. The wafer support platter of the pedestal (preferably aluminum,ceramic, or a combination thereof) may also be resistively heated toachieve relatively high temperatures (from about 120° C. through about1100° C.) using an embedded single-loop embedded heater elementconfigured to make two full turns in the form of parallel concentriccircles. An outer portion of the heater element may run adjacent to aperimeter of the support platter, while an inner portion runs on thepath of a concentric circle having a smaller radius. The wiring to theheater element passes through the stem of the pedestal.

The chamber plasma region and/or a region in a remote plasma system maybe referred to as a remote plasma region. In embodiments, the radicalprecursors (e.g. radical-fluorine) are formed in the remote plasmaregion and travel into the substrate processing region where they mayindividually react with chamber walls or the substrate surface. Plasmapower may essentially be applied only to the remote plasma region, inembodiments, to ensure that the radical-fluorine (which may also bereferred to as plasma effluents) are not further excited in thesubstrate processing region.

In embodiments employing a chamber plasma region, the excited plasmaeffluents are generated in a section of the substrate processing regionpartitioned from a deposition region. The deposition region, also knownherein as the substrate processing region, is where the plasma effluentsmix and react to etch the patterned substrate (e.g., a semiconductorwafer). The excited plasma effluents may also be accompanied by inertgases. The substrate processing region may be described herein as“plasma-free” during etching of the substrate. “Plasma-free” does notnecessarily mean the region is devoid of plasma. A relatively lowconcentration of ionized species and free electrons created within theremote plasma region do travel through pores (apertures) in thepartition (showerhead/ion suppressor) due to the shapes and sizes ofthrough-holes 1056. In some embodiments, there is essentially noconcentration of ionized species and free electrons within the substrateprocessing region. In embodiments, the electron temperature may be lessthan 0.5 eV, less than 0.45 eV, less than 0.4 eV, or less than 0.35 eVin substrate processing region 1070 during excitation of a remoteplasma. The borders of the plasma in the chamber plasma region are hardto define and may encroach upon the substrate processing region throughthe apertures in the showerhead. In the case of an inductively-coupledplasma, a small amount of ionization may be effected within thesubstrate processing region directly.

Furthermore, a low intensity plasma may be created in the substrateprocessing region without eliminating desirable features of the formingfilm. All causes for a plasma having much lower intensity ion densitythan the chamber plasma region (or a remote plasma region, for thatmatter) during the creation of the excited plasma effluents do notdeviate from the scope of “plasma-free” as used herein.

The fluorine-containing precursor) may be flowed into chamber plasmaregion 1020 at rates between about 5 sccm and about 500 sccm, betweenabout 10 sccm and about 300 sccm, between about 25 sccm and about 200sccm, between about 50 sccm and about 150 sccm or between about 75 sccmand about 125 sccm in embodiments.

The flow rate of the fluorine-containing precursor into the chamber mayaccount for 0.05% to about 20% by volume of the overall gas mixture; theremainder being carrier gases. The fluorine-containing precursor areflowed into the remote plasma region but the plasma effluents have thesame volumetric flow ratio, in embodiments. A purge or carrier gas maybe initiated into the remote plasma region before that of thefluorine-containing gas to stabilize the pressure within the remoteplasma region.

Plasma power applied to the remote plasma region can be a variety offrequencies or a combination of multiple frequencies. In the exemplaryprocessing system the plasma is provided by oscillating power deliveredbetween lid 1021 and showerhead 1053. The energy is applied using acapacitively-coupled plasma unit. The remote plasma source power may bebetween about 10 watts and about 3000 watts, between about 20 watts andabout 2000 watts, between about 30 watts and about 1000 watts, orbetween about 40 watts and about 500 watts in embodiments.

Substrate processing region 1070 can be maintained at a variety ofpressures during the flow of carrier gases and plasma effluents intosubstrate processing region 1070. The pressure within the substrateprocessing region is below or about 50 Torr, below or about 30 Torr orbelow or about 20 Torr. The pressure may be above or about 0.1 Torr,above or about 0.2 Torr, above or about 0.5 Torr or above or about 1Torr in embodiments. Lower limits on the pressure may be combined withupper limits on the pressure to obtain embodiments.

In one or more embodiments, the substrate processing chamber 1001 can beintegrated into a variety of multi-processing platforms, including theProducer™ GT, Centura™ AP and Endura™ platforms available from AppliedMaterials, Inc. located in Santa Clara, Calif. Such a processingplatform is capable of performing several processing operations withoutbreaking vacuum. Processing chambers that may implement embodiments ofthe present invention may include dielectric etch chambers or a varietyof chemical vapor deposition chambers, among other types of chambers.

Embodiments of the etching systems may be incorporated into largerfabrication systems for producing integrated circuit chips. FIG. 5 showsone such system 1101 of etching, deposition, baking and curing chambersaccording to embodiments. In the figure, a pair of FOUPs (front openingunified pods) 1102 supply substrate substrates (e.g., 300 mm diameterwafers) that are received by robotic arms 1104 and placed into a lowpressure holding areas 1106 before being placed into one of the waferprocessing chambers 1108 a-f. A second robotic arm 1110 may be used totransport the substrate wafers from the low pressure holding areas 1106to the wafer processing chambers 1108 a-f and back. Each waferprocessing chamber 1108 a-f, can be outfitted to perform a number ofsubstrate processing operations including the dry etch processesdescribed herein in addition to cyclical layer deposition (CLD), atomiclayer deposition (ALD), chemical vapor deposition (CVD), physical vapordeposition (PVD), etch, pre-clean, degas, orientation and othersubstrate processes.

The wafer processing chambers 1108 a-f may include one or more systemcomponents for depositing, annealing, curing and/or etching a dielectricfilm on the substrate wafer. In one configuration, two pairs of theprocessing chamber (e.g., 1108 c-d and 1108 e-f) may be used to depositdielectric material on the substrate, and the third pair of processingchambers (e.g., 1108 a-b) may be used to etch the deposited dielectric.In another configuration, all three pairs of chambers (e.g., 1108 a-f)may be configured to etch a dielectric film on the substrate. Any one ormore of the processes described may be carried out on chamber(s)separated from the fabrication system shown in different embodiments.

The substrate processing system is controlled by a system controller. Inan exemplary embodiment, the system controller includes a hard diskdrive, a floppy disk drive and a processor. The processor contains asingle-board computer (SBC), analog and digital input/output boards,interface boards and stepper motor controller boards. Various parts ofCVD system conform to the Versa Modular European (VME) standard whichdefines board, card cage, and connector dimensions and types. The VMEstandard also defines the bus structure as having a 16-bit data bus anda 24-bit address bus.

System controller 1157 is used to control motors, valves, flowcontrollers, power supplies and other functions required to carry outprocess recipes described herein. A gas handling system 1155 may also becontrolled by system controller 1157 to introduce gases to one or all ofthe wafer processing chambers 1108 a-f. System controller 1157 may relyon feedback from optical sensors to determine and adjust the position ofmovable mechanical assemblies in gas handling system 1155 and/or inwafer processing chambers 1108 a-f. Mechanical assemblies may includethe robot, throttle valves and susceptors which are moved by motorsunder the control of system controller 1157.

In an exemplary embodiment, system controller 1157 includes a hard diskdrive (memory), USB ports, a floppy disk drive and a processor. Systemcontroller 1157 includes analog and digital input/output boards,interface boards and stepper motor controller boards. Various parts ofmulti-chamber processing system 1101 which contains substrate processingchamber 1001 are controlled by system controller 1157. The systemcontroller executes system control software in the form of a computerprogram stored on computer-readable medium such as a hard disk, a floppydisk or a flash memory thumb drive. Other types of memory can also beused. The computer program includes sets of instructions that dictatethe timing, mixture of gases, chamber pressure, chamber temperature, RFpower levels, susceptor position, and other parameters of a particularprocess.

A process for etching, depositing or otherwise processing a film on asubstrate or a process for cleaning chamber can be implemented using acomputer program product that is executed by the controller. Thecomputer program code can be written in any conventional computerreadable programming language: for example, 68000 assembly language, C,C++, Pascal, Fortran or others. Suitable program code is entered into asingle file, or multiple files, using a conventional text editor, andstored or embodied in a computer usable medium, such as a memory systemof the computer. If the entered code text is in a high level language,the code is compiled, and the resultant compiler code is then linkedwith an object code of precompiled Microsoft Windows® library routines.To execute the linked, compiled object code the system user invokes theobject code, causing the computer system to load the code in memory. TheCPU then reads and executes the code to perform the tasks identified inthe program.

The interface between a user and the controller may be via atouch-sensitive monitor and may also include a mouse and keyboard. Inone embodiment two monitors are used, one mounted in the clean room wallfor the operators and the other behind the wall for the servicetechnicians. The two monitors may simultaneously display the sameinformation, in which case only one is configured to accept input at atime. To select a particular screen or function, the operator touches adesignated area on the display screen with a finger or the mouse. Thetouched area changes its highlighted color, or a new menu or screen isdisplayed, confirming the operator's selection.

As used herein “substrate” may be a support substrate with or withoutlayers formed thereon. The patterned substrate may be an insulator or asemiconductor of a variety of doping concentrations and profiles andmay, for example, be a semiconductor substrate of the type used in themanufacture of integrated circuits. Exposed “silicon” of the patternedsubstrate is predominantly Si but may include minority concentrations ofother elemental constituents (e.g. nitrogen, oxygen, hydrogen, carbon).Exposed “silicon nitride” of the patterned substrate is predominantlySi₃N₄ but may include minority concentrations of other elementalconstituents (e.g. oxygen, hydrogen, carbon). Exposed “silicon oxide” ofthe patterned substrate is predominantly SiO₂ but may include minorityconcentrations of other elemental constituents (e.g. nitrogen, hydrogen,carbon). In some embodiments, silicon oxide films etched using themethods disclosed herein consist essentially of silicon and oxygen.

The term “precursor” is used to refer to any process gas which takespart in a reaction to either remove material from or deposit materialonto a surface. “Plasma effluents” describe gas exiting from the chamberplasma region and entering the substrate processing region. Plasmaeffluents are in an “excited state” wherein at least some of the gasmolecules are in vibrationally-excited, dissociated and/or ionizedstates. A “radical precursor” is used to describe plasma effluents (agas in an excited state which is exiting a plasma) which participate ina reaction to either remove material from or deposit material on asurface. “Radical-fluorine” are radical precursors which containfluorine but may contain other elemental constituents. The phrase “inertgas” refers to any gas which does not form chemical bonds when etchingor being incorporated into a film. Exemplary inert gases include noblegases but may include other gases so long as no chemical bonds areformed when (typically) trace amounts are trapped in a film.

The terms “gap” and “trench” are used throughout with no implicationthat the etched geometry has a large horizontal aspect ratio. Viewedfrom above the surface, trenches may appear circular, oval, polygonal,rectangular, or a variety of other shapes. A trench may be in the shapeof a moat around an island of material. The term “via” is used to referto a low aspect ratio trench (as viewed from above) which may or may notbe filled with metal to form a vertical electrical connection. As usedherein, a conformal etch process refers to a generally uniform removalof material on a surface in the same shape as the surface, i.e., thesurface of the etched layer and the pre-etch surface are generallyparallel. A person having ordinary skill in the art will recognize thatthe etched interface likely cannot be 100% conformal and thus the term“generally” allows for acceptable tolerances.

Having disclosed several embodiments, it will be recognized by those ofskill in the art that various modifications, alternative constructions,and equivalents may be used without departing from the spirit of thedisclosed embodiments. Additionally, a number of well known processesand elements have not been described to avoid unnecessarily obscuringthe present invention. Accordingly, the above description should not betaken as limiting the scope of the invention.

Where a range of values is provided, it is understood that eachintervening value, to the tenth of the unit of the lower limit unlessthe context clearly dictates otherwise, between the upper and lowerlimits of that range is also specifically disclosed. Each smaller rangebetween any stated value or intervening value in a stated range and anyother stated or intervening value in that stated range is encompassed.The upper and lower limits of these smaller ranges may independently beincluded or excluded in the range, and each range where either, neitheror both limits are included in the smaller ranges is also encompassedwithin the invention, subject to any specifically excluded limit in thestated range. Where the stated range includes one or both of the limits,ranges excluding either or both of those included limits are alsoincluded.

As used herein and in the appended claims, the singular forms “a”, “an”,and “the” include plural referents unless the context clearly dictatesotherwise. Thus, for example, reference to “a process” includes aplurality of such processes and reference to “the dielectric material”includes reference to one or more dielectric materials and equivalentsthereof known to those skilled in the art, and so forth.

Also, the words “comprise,” “comprising,” “include,” “including,” and“includes” when used in this specification and in the following claimsare intended to specify the presence of stated features, integers,components, or steps, but they do not preclude the presence or additionof one or more other features, integers, components, steps, acts, orgroups.

The invention claimed is:
 1. A method of forming a flash memory cell ona substrate, the method comprising: forming dummy silicon oxide overactive area silicon on the substrate; forming polysilicon over the dummysilicon oxide; patterning the polysilicon and the dummy silicon oxideinto a stack having vertical walls; forming conformal silicon oxide onthe vertical walls of the stack, wherein the conformal silicon oxideborders walls of the polysilicon, the dummy silicon oxide and the activearea silicon; selectively removing the dummy silicon oxide to leavebehind a void, wherein the conformal silicon oxide, the polysilicon andthe active area silicon all remain in place following the selectiveremoval of the dummy silicon oxide; and depositing non-conformaldielectric to trap the void in the flash memory cell.
 2. The method ofclaim 1 wherein the dummy silicon oxide comprises doped silicon oxide.3. The method of claim 1 wherein the conformal silicon oxide isessentially undoped or doped with a dopant concentration less than orabout 10¹⁴ cm⁻³.
 4. The method of claim 1 wherein a dopant concentrationof the dummy silicon oxide is greater than or about 10¹⁴ cm⁻³.
 5. Themethod of claim 1 wherein a vertical thickness of the void is less than6.5 nm.
 6. The method of claim 1 wherein a thickness of the conformalsilicon oxide is greater than 2.5 nm.
 7. The method of claim 1 whereinthe operation of selectively removing the dummy silicon oxide is anisotropic removal process.
 8. A flash memory cell comprising: an activearea of silicon on the substrate; a polysilicon floating gate over theactive area of silicon, wherein the polysilicon floating gate isvertically separated from the active area of silicon by a void in whichthere is no condensed matter but only vacuum or material in a gas phase;and conformal silicon oxide which contacts sidewalls of both thepolysilicon and the active area silicon, wherein the conformal siliconoxide also borders the void.
 9. The flash memory cell of claim 8 whereinthe dummy silicon oxide comprises doped silicon oxide.
 10. The flashmemory cell of claim 8 wherein the dummy silicon oxide is boron-doped.11. The flash memory cell of claim 8 wherein the conformal silicon oxideis doped with a dopant concentration less than or about 10¹³ cm⁻³. 12.The flash memory cell of claim 8 wherein a dopant concentration of thedummy silicon oxide is greater than or about 10¹⁵ cm⁻³.
 13. The flashmemory cell of claim 8 wherein a vertical thickness of the void is lessthan 5.5 nm.
 14. The flash memory cell of claim 8 wherein a thickness ofthe conformal silicon oxide is greater than 2.5 nm.
 15. A method offorming a flash memory cell on a substrate, the method comprising:forming dummy silicon oxide over active area silicon on the substrate;forming polysilicon over the dummy silicon oxide; patterning thepolysilicon and the dummy silicon oxide into a stack having verticalwalls; forming conformal silicon oxide on the vertical walls of thestack, wherein the conformal silicon oxide borders a vertical wall ofthe polysilicon, a vertical wall of the dummy silicon oxide and avertical wall of the active area silicon; transferring the patternedsubstrate into a substrate processing region of a substrate processingchamber; flowing a fluorine-containing precursor into a remote plasmaregion fluidly coupled to the substrate processing region while forminga plasma in the remote plasma region to produce plasma effluents;flowing the plasma effluents into the substrate processing regionhousing the substrate, wherein the plasma effluents flow into thesubstrate processing region through perforations in an ion suppressionelement disposed between the remote plasma region and the substrateprocessing region; selectively removing the dummy silicon oxide with theplasma effluents to leave behind a void, wherein the conformal siliconoxide, the polysilicon and the active area silicon all remain in placefollowing the selective removal of the dummy silicon oxide; anddepositing non-conformal silicon oxide to trap the void in the flashmemory cell.